Design of a built-in multi-mode ICs tester with higher testability features—a most suitable testing tool for BIST environment

Afaq Ahmad*, Amer H. Al-Habsi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Design of a built-in multi-mode ICs tester with higher testability features—a most suitable testing tool for BIST environment'. Together they form a unique fingerprint.

Computer Science