The magnetoresistance acquisition system of a perpendicular magnetic tunnel junction using LabVIEW software

For accelerated productivity, and continual innovation in the field of spintronics, the electrical characterization of the magnetic tunnel junction (MTJs) is of paramount importance. This report deals with the testing of the MTJs. It focuses on the design of an experimental setup with data acquisition of the MTJs with perpendicular magnetic tunnel junctions where a high magnetic field aligned perpendicular to the film plane is required. Furthermore, devices with very small electrodes of only a few micrometers in lateral size can be tested. A computer through a LabVIEW program controls the data acquisition system.