The magnetoresistance acquisition system of a perpendicular magnetic tunnel junction using LabVIEW software

N. Rahman, R. Sbiaa*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


For accelerated productivity, and continual innovation in the field of spintronics, the electrical characterization of the magnetic tunnel junction (MTJs) is of paramount importance. This report deals with the testing of the MTJs. It focuses on the design of an experimental setup with data acquisition of the MTJs with perpendicular magnetic tunnel junctions where a high magnetic field aligned perpendicular to the film plane is required. Furthermore, devices with very small electrodes of only a few micrometers in lateral size can be tested. A computer through a LabVIEW program controls the data acquisition system.

Original languageEnglish
Article numberP04032
JournalJournal of Instrumentation
Issue number4
Publication statusPublished - Apr 1 2023
Externally publishedYes


  • Data acquisition circuits
  • Data acquisition concepts

ASJC Scopus subject areas

  • Instrumentation
  • Mathematical Physics

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