Resubmitted sampling inspection plan for exponentiated weibull distribution

Muhammad Aslam*, Nasrullah Khan, Nisar Ahmad, Chi Hyuck Jun

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


This paper provides a resubmitted lot inspection plan based on the truncated life test when the failure time of a product is modeled by the exponentiated Weibull distribution. The plan parameters are determined by solving the optimization problem of minimizing the average sample number while satisfying the producer's and the consumer's risks. The proposed plan was found to be more efficient than the single inspection plan when it was applied in the carbon fiber industry.

Original languageEnglish
Pages (from-to)622-628
Number of pages7
JournalJournal of Testing and Evaluation
Issue number3
Publication statusPublished - May 1 2015
Externally publishedYes


  • Exponentiated Weibull distribution
  • Optimization problem
  • Truncated life test

ASJC Scopus subject areas

  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering


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