Reliable and Fault Tolerant Systems on Chip Through Design for Testability

Research output: Contribution to conferencePaperpeer-review

3 Citations (Scopus)


Today’s fast growing electrical and electronics industry manufacture products that are used everywhere ranging from aerospace products, medical equipment, household appliances, automation systems to automotive telematics and consumer electronics. In 2018, the worldwide growth of the industry is expected to grow by around four percent, the European electrical and electronics industry market is projected to grow by around two percent, whereas, the annual projection for Asia and USA is expected to experience the strongest growth of around five percent. Given today’s fast growing semiconductor industry, this talk will discuss the various emerging challenges in hardware test technology which is critical not just to ensure the quality of an electronic device, but also its reliability, security, and safety in the field. The talk will also highlight the benefits of selecting ISO 26262 certified solutions to ensure standardized quality, reliability, security and safety.
Original languageEnglish
Number of pages4
Publication statusPublished - Apr 26 2019


  • Built-in self-test
  • Design for test
  • IC
  • LFSR
  • Reliability
  • Response data compression
  • Semiconductor
  • Test pattern

ASJC Scopus subject areas

  • Artificial Intelligence


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