Online Failure Detection using Deep Learning in FPGA PCB Interface

Afaq Ahmad, M. Abdul Kareem, Ahmed Al Maashri, Medhat Awadallah, Sayyid Samir Al Busaidi, Maram Ahmed Al Khuzaimi

Research output: Contribution to journalArticlepeer-review

Abstract

This research paper is aimed to present a real-time failure detection technique while working with Field Programmable Gate Arrays (FPGA) and interfaced Printed Circuit Boards (PCBs). In this research, we explored the feasibility of currently available innovative Deep Learning (DL) algorithms to detect the defects in variety of PCBs. In our proposed technique, we trained the YOLOv5 (You Only Look Once) algorithm with a few hundreds of defective PCBs’ images, which were obtained from Kaggle, an online community of data scientists and machine learning practitioners. The advantage of using YOLOv5 is that the detection is carried out in real-time. In the next phase, after training, the algorithm undergoes validation and testing, where we tested with different images. The obtained results are promising, as the Deep Learning process successfully detects the defects on the PCBs.
Original languageEnglish
Pages (from-to)21
Number of pages26
JournalInternational Journal of Advanced Natural Sciences and Engineering Researches (IJANSER)
Volume7
Issue number6
Publication statusPublished - Jul 13 2023

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