Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy

S. N. Piramanayagam; M. Ranjbar; E. L. Tan; H. K. Tan; R. Sbiaa; T. C. Chong

doi:10.1063/1.3551733

Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy

S. N. Piramanayagam, M. Ranjbar, E. L. Tan, H. K. Tan, R. Sbiaa, T. C. Chong

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

Magnetic force microscopy (MFM) is commonly used for the characterization of magnetic nanostructures, which gets challenging for sub-20 nm features. The typical resolution of commercial MFM tips stands at about 30 nm, whereas sub-15 nm resolution has been reported by extensive modifications of the tip. In this paper, we show that a tip coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA) offers superior resolution compared to tips without PMA. The advantages of a tip with PMA have been demonstrated based on writing magnetic transitions in a commercial perpendicular media. MFM images and line scans at different scan heights are presented along with an explanation for the observed improvement in performance.

Original language	English
Article number	07E326
Journal	Journal of Applied Physics
Volume	109
Issue number	7
DOIs	https://doi.org/10.1063/1.3551733
Publication status	Published - Apr 1 2011
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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10.1063/1.3551733

Cite this

@article{f2942d566b8043939e806810d42f390c,

title = "Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy",

abstract = "Magnetic force microscopy (MFM) is commonly used for the characterization of magnetic nanostructures, which gets challenging for sub-20 nm features. The typical resolution of commercial MFM tips stands at about 30 nm, whereas sub-15 nm resolution has been reported by extensive modifications of the tip. In this paper, we show that a tip coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA) offers superior resolution compared to tips without PMA. The advantages of a tip with PMA have been demonstrated based on writing magnetic transitions in a commercial perpendicular media. MFM images and line scans at different scan heights are presented along with an explanation for the observed improvement in performance.",

author = "Piramanayagam, {S. N.} and M. Ranjbar and Tan, {E. L.} and Tan, {H. K.} and R. Sbiaa and Chong, {T. C.}",

note = "Funding Information: The authors thank Mr. Y. S. Kay for his help in preparing samples and M. R. would like to express gratitude for support from the A*STAR (SINGA) Graduate Scholarship program.",

year = "2011",

month = apr,

day = "1",

doi = "10.1063/1.3551733",

language = "English",

volume = "109",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "7",

}

TY - JOUR

T1 - Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy

AU - Piramanayagam, S. N.

AU - Ranjbar, M.

AU - Tan, E. L.

AU - Tan, H. K.

AU - Sbiaa, R.

AU - Chong, T. C.

N1 - Funding Information: The authors thank Mr. Y. S. Kay for his help in preparing samples and M. R. would like to express gratitude for support from the A*STAR (SINGA) Graduate Scholarship program.

PY - 2011/4/1

Y1 - 2011/4/1

N2 - Magnetic force microscopy (MFM) is commonly used for the characterization of magnetic nanostructures, which gets challenging for sub-20 nm features. The typical resolution of commercial MFM tips stands at about 30 nm, whereas sub-15 nm resolution has been reported by extensive modifications of the tip. In this paper, we show that a tip coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA) offers superior resolution compared to tips without PMA. The advantages of a tip with PMA have been demonstrated based on writing magnetic transitions in a commercial perpendicular media. MFM images and line scans at different scan heights are presented along with an explanation for the observed improvement in performance.

AB - Magnetic force microscopy (MFM) is commonly used for the characterization of magnetic nanostructures, which gets challenging for sub-20 nm features. The typical resolution of commercial MFM tips stands at about 30 nm, whereas sub-15 nm resolution has been reported by extensive modifications of the tip. In this paper, we show that a tip coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA) offers superior resolution compared to tips without PMA. The advantages of a tip with PMA have been demonstrated based on writing magnetic transitions in a commercial perpendicular media. MFM images and line scans at different scan heights are presented along with an explanation for the observed improvement in performance.

UR - http://www.scopus.com/inward/record.url?scp=79955390406&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79955390406&partnerID=8YFLogxK

U2 - 10.1063/1.3551733

DO - 10.1063/1.3551733

M3 - Article

AN - SCOPUS:79955390406

SN - 0021-8979

VL - 109

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 7

M1 - 07E326

ER -

Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy

Abstract

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