Abstract
Constant error masking behavior of an internal exclusive-OR type signature analyzer due to the changed polynomial seeds was analyzed. Simulation study showed that the change of the polynomial seed does not any have impact on the effectiveness of the internal exclusive-OR type siganture analyzer used in the linear feedback shift registers (LFSR). It was found that the counts of the error masks remained unchanged due to the change of the seeds.
| Original language | English |
|---|---|
| Pages (from-to) | 577-585 |
| Number of pages | 9 |
| Journal | Computers and Electrical Engineering |
| Volume | 28 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - Nov 2002 |
Keywords
- BIST
- Digital circuit testing
- Error masking
- Internal exclusive OR
- LFSR
- Polynomial seeds
- Pseudo-random test patterns
- Signature analyzer
ASJC Scopus subject areas
- Control and Systems Engineering
- General Computer Science
- Electrical and Electronic Engineering